Displays The Depth Distributions Of 400 Kev Er Ions Implanted In Si
displays the depth distributions of 400 keV Er ions implanted in Si ...
displays the depth distributions of 400 keV Er ions implanted in Si ...
Estimated depth profile of 400 keV Si ions simulated with Srim2003 ...
RBS SPECTRUM OF 400 keV, 2×10 15 ions/cm 2 Er IONS IMPLANTED IN SOI ...
Depth profiles of Fe ions implanted into Si at 7.5 keV with various ...
RBS SPECTRUM OF 400 keV, 2×10 15 ions/cm 2 Er IONS IMPLANTED IN SOI ...
a) Normalized depth distributions of the implanted ions (dotted lines ...
a) Normalized depth distributions of the implanted ions (dotted lines ...
Depth distributions of impurities in Si after "hot" implantation with ...
TRIDYN simulation of the implantation of 45 keV 28 Si ions into nat Si ...
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Comparison of (1) the measured depth distribution of implanted Fe ions ...
Kinetic energy distributions of Si + ions produced due to 3–5 keV Ar ...
The disorder depth profile in the Si substrate, resulting from 60 keV ...
In and As depth distributions in the implanted sample: (a) the ...
RBS/C spectra of ZnO implanted at room temperature with 200 keV Er ions ...
Depth positions of the amorphous layers created by various ions in Ge ...
The disorder depth profile in the Si substrate, resulting from 60 keV ...
PL spectra as a function of fluence of Si ions implanted a) at 100 keV ...
Depth of the damaged Si as function of the ion implantation energy, as ...
represents the RBS spectrum of the deepness distribution of 400 keV ...
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Depth profiles of implanted Si⁺ ions (dose 10¹³ cm⁻²) and divacancies ...
Depth distributions of (a) 1.5 MeV and (b) 600 keV energy proton ...
Depth distributions of (a) 1.5 MeV and (b) 600 keV energy proton ...
a Depth of implantation using stopping and range of ions in matter ...
In-depth composition of the implanted ar atoms in si(1 00)
Ion range distributions for 3 keV O⁺ ions and 6 keV O⁺ ions implanted ...
a. Distribution in depth N(x) of implanted Ge + -ions into | Download ...
Depth distributions of (a) 1.5 MeV and (b) 600 keV energy proton ...
Depth distributions of (a) 1.5 MeV and (b) 600 keV energy proton ...
Calculated damage and ion depth profiles of silicon implanted at 5 keV ...
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(Color online) Depth profiles of 200 eV B ions and 2 keV Ge ions ...
(a) 2D depth profile of a 14 keV P + implant into a Si substrate with a ...
Depth distributions of concentration of Cd ions (full symbols) and S ...
Depth profiles of P implanted at 2 keV and normal incidence measured ...
Depth distributions of H and Ge atoms in heterostructures obtained from ...
(a) Depth distribution of Cr ions implanted into copper oxides with ...