Gd Sims Depth Profiles Of Pt Gd 2 O 3 Si Stacks Subjected To Fga
Gd SIMS depth profiles of Pt / Gd 2 O 3 / Si stacks subjected to FGA ...
Gd SIMS depth profiles of Pt / Gd 2 O 3 / Si stacks subjected to FGA ...
SIMS depth profiles of Pt / Gd 2 O 3 / Si stacks ͑ a ͒ before and ͑ b ͒ ...
͑ a ͒ Gd and ͑ b ͒ CsSi SIMS depth profiles of Pt / Gd 2 O 3 / Si ...
͑ a ͒ Gd and ͑ b ͒ CsSi SIMS depth profiles of Pt / Gd 2 O 3 / Si ...
SIMS depth profiles of Si in Ga 2 O 3 :Si films deposited at 550 • C ...
SIMS depth profiles of Si in Ga 2 O 3 :Si films deposited at 550 • C ...
Compilation of SIMS profiles of Si implants in Ga 2 O 3 annealed at ...
Compilation of SIMS profiles of Si implants in Ga 2 O 3 annealed at ...
Compilation of SIMS profiles of Si implants in Ga 2 O 3 annealed at ...
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SIMS depth profiles of Si concentration in homoepitaxial (100) β-Ga 2 O ...
DTG and DTA profiles of Gd 2 O 3 (2.5 at.% Eu 3+ , 0.005 at.% Tb 3 ...
SIMS depth profiles of HT-LPCVD homoepitaxial β-Ga 2 O 3 film grown on ...
SIMS depth profiles measured in a 25 nm thick ε-Fe 2 O 3 /GaN film ...
Figure S3: XRR curves of Gd 2 O 3 /Si samples located at different ...
The SIMS profiles of (a) as-deposited b-Ga 2 O 3 and the samples ...
SIMS depth profiles of (a) Fe, (b) Si and (c) Pt in specimen S2 for ...
Formation of self-assembled Gd 2 O 3 nanowire-like structures during ...
Figure S3: XRR curves of Gd 2 O 3 /Si samples located at different ...
Figure S6. TEM images of Gd 2 O 3 /GO nanocomposites. Core size 17 nm ...
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Emission spectra of Gd2O3:Eu 3+ and Gd 2 O 3 :Eu 3+ @SiO 2 composites ...
XRD patterns of the Gd 2 O 3 and Dy 2 O 3 nanoparticles calcined at 600 ...
Formation of self-assembled Gd 2 O 3 nanowire-like structures during ...
(a) HRTEM image of the heterostructure of the epitaxial Gd 2 O 3 film ...
Comparison of Ge and Si depth profiles as measured by SIMS in ...
SIMS depth profiles relative to Si in homoepitaxial (100) β-Ga2O3 ...
͑ Color online ͒ Ge and O depth profiles as determined by SIMS of ...
SIMS depth profiles of Ga+N, O, As, and Si in (a) sample C and (b ...
Comparison of Ge and Si depth profiles as measured by SIMS in ...
SIMS depth profiles of Ge and Si in Si capping layer grown with SiH 4 ...
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SIMS depth profiles of Co, Fe, Si, (Ge), and O (a) in a RTA-treated ...
SIMS depth profiles of ONO stacks with Si-NCs annealed in a ...
SIMS depth profiles of the Ga, N, and O atomic signals before and after ...
SIMS profiles of Fe, Y, Ga, and Gd positive ions measured in YIG layers ...
SIMS depth profiles of C, Pt, and Si species in Pt-ion implanted ...
SIMS depth profiles of Si implanted in β-Ga2O3 at various doses with no ...