A Sims Depth Profiles Of O Elements In Ta 2 O 5 Altacu Samples

͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in Ta 2 O 5 /Al/Ta/Cu samples ...
͑ a ͒ SIMS depth profiles of O elements in the Ta 2 O 5 /Ta/Cu/Ta ...
͑ a ͒ SIMS depth profiles of O elements in the Ta 2 O 5 /Ta/Cu/Ta ...
a) XPS depth profiles of O, Ag, Ta and Cu in the Ag (10 nm)/Ta 2 O 5 ...
a) XPS depth profiles of O, Ag, Ta and Cu in the Ag (10 nm)/Ta 2 O 5 ...
(a) SIMS depth profiles of C, O and Ga in samples A and B. Ga is used ...
(a) SIMS depth profiles of C, O and Ga in samples A and B. Ga is used ...
a) XPS depth profiles of O, Ag, Ta and Cu in the Ag (10 nm)/Ta 2 O 5 ...
a) XPS depth profiles of O, Ag, Ta and Cu in the Ag (10 nm)/Ta 2 O 5 ...
Si + depth profile (SIMS) of SiO 2 layers in Ta 2 O 5 , measured [19 ...
Si + depth profile (SIMS) of SiO 2 layers in Ta 2 O 5 , measured [19 ...
Concentration profiles of O, Ta and Si in 15 nm Ta 2 O 5 on Si before ...
Concentration profiles of O, Ta and Si in 15 nm Ta 2 O 5 on Si before ...
Negative O SIMS depth profile of a SiO 2 5 nm / HfO 2 15 nm / SiO 2 5 ...
Negative O SIMS depth profile of a SiO 2 5 nm / HfO 2 15 nm / SiO 2 5 ...
AES depth profiles of the Ta 2 O 5 /RuO 2 films deposited on the Si ...
AES depth profiles of the Ta 2 O 5 /RuO 2 films deposited on the Si ...
͑ a ͒ Gd and ͑ b ͒ CsSi SIMS depth profiles of Pt / Gd 2 O 3 / Si ...
͑ a ͒ Gd and ͑ b ͒ CsSi SIMS depth profiles of Pt / Gd 2 O 3 / Si ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
FTIR spectra of Ta 2 O 5 films deposited at a substrate temperature of ...
FTIR spectra of Ta 2 O 5 films deposited at a substrate temperature of ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
(a) SIMS depth profile of Mg, Zn, Al and O elements in Zn0.94Mg0.06O ...
(a) SIMS depth profile of Mg, Zn, Al and O elements in Zn0.94Mg0.06O ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
Sputter depth profiling of Ta 2 O 5 showing the Ta 4f 7/2 and 4f 5/2 ...
Sputter depth profiling of Ta 2 O 5 showing the Ta 4f 7/2 and 4f 5/2 ...
(a~c) SIMS depth profiles of H, V and O elements for the pristine VO2 ...
(a~c) SIMS depth profiles of H, V and O elements for the pristine VO2 ...
Calibrated SIMS O depth profiles of samples vacuum heat treated at ...
Calibrated SIMS O depth profiles of samples vacuum heat treated at ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
The SIMS profiles of Ti þ component for the samples using O 2 þ ion ...
The SIMS profiles of Ti þ component for the samples using O 2 þ ion ...
Calibrated SIMS O depth profiles of samples vacuum heat treated at ...
Calibrated SIMS O depth profiles of samples vacuum heat treated at ...
Depth pro®le analysis of 10 nm Ta 2 O 5 /Ta ̄at structure. Secondary ...
Depth pro®le analysis of 10 nm Ta 2 O 5 /Ta ̄at structure. Secondary ...
Gd SIMS depth profiles of Pt / Gd 2 O 3 / Si stacks subjected to FGA ...
Gd SIMS depth profiles of Pt / Gd 2 O 3 / Si stacks subjected to FGA ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
ToF-SIMS depth profiles of: (a) pure Ta 2 O 5 and surface doped Ta 2 O ...
(a) SIMS depth profile of Mg, Zn, Al and O elements in Zn0.94Mg0.06O ...
(a) SIMS depth profile of Mg, Zn, Al and O elements in Zn0.94Mg0.06O ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
SIMS profiles of 'regular O 2 content' samples S1 (noncapped, a) and S2 ...
SIMS depth profile for ͑ a ͒ Si, C, and N and ͑ b ͒ O and H in the ...
SIMS depth profile for ͑ a ͒ Si, C, and N and ͑ b ͒ O and H in the ...
Qualitative SIMS depth profiles of Si, N, Nd, and O after annealing at ...
Qualitative SIMS depth profiles of Si, N, Nd, and O after annealing at ...
SIMS depth profiles of Al + and O + for the surface layers of Fe-5.9%Al ...
SIMS depth profiles of Al + and O + for the surface layers of Fe-5.9%Al ...
SIMS depth profiles of Al + and O + for the surface layers of Fe-5.9%Al ...
SIMS depth profiles of Al + and O + for the surface layers of Fe-5.9%Al ...
SIMS depth profiles of Na (red lines) and O (black lines) measured on ...
SIMS depth profiles of Na (red lines) and O (black lines) measured on ...
(Color online) SIMS depth profile of a ZnTeO layer with O composition x ...
(Color online) SIMS depth profile of a ZnTeO layer with O composition x ...
Color online a 18 O SIMS depth profile of SrTiO 3 on SrTi 18 O 3 grown ...
Color online a 18 O SIMS depth profile of SrTiO 3 on SrTi 18 O 3 grown ...

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