Siris Depth Profile Of Cu Implanted With 150 Kev Energy In Si And Sio2
SIRIS depth profile of Cu implanted with 150 keV energy in Si and SiO2 ...
SIRIS depth profile of Cu implanted with 150 keV energy in Si and SiO2 ...
SIRIS depth profile of Cu implanted with 150 keV energy in Si and SiO2 ...
2: (a) Implantation depth profiles of Si implanted into SiO2 in the 60 ...
XTEM images of Si implanted with Li (150 keV and 7 Â 10 15 cm À 2 ...
SIMS profiles of P implanted in crystalline germanium with 150 keV ...
XTEM images of Si implanted with Li (150 keV and 7 × 1015 cm−2) at ...
displays the depth distributions of 400 keV Er ions implanted in Si ...
SIMS depth profiles of C, Pt, and Si species in Pt-ion implanted ...
SIMS profile of Si implanted into GaAs:Si (150 keV, 10 15 at/cm 2 ) and ...
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SIMS profile of Si implanted into GaAs:Si (150 keV, 10 15 at/cm 2 ) and ...
Depth profiles of Si ions using SIMS for samples implanted with nominal ...
SRIM profiles (red solid lines) of 150 keV implanted GaN with doses of ...
SIMS profile of Si implanted into GaAs:Si (150 keV, 10 15 at/cm 2 ) and ...
Figure 2 from Transient effects in SIMS depth profile analysis of 1 keV ...
Variation of electrical activation with implant dose for 150 keV Si ...
Depth profiles of 1 keV Si + implanted into SiO 2 as predicted by TRIM ...
Dependences of the distribution of Cu + ions implanted with an energy ...
SIMS profile of a deeply implanted B+ peak while implanting a 150 keV ...
XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
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XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
PLE spectrum of the SiO2 (600 nm)/Si samples implanted with 200 keV Sn ...
XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
XTEM images of SiO2 (600 nm)/Si samples implanted with 200 keV Sn⁺ to a ...
(a) 1 MeV 4 He ++ RBS spectra of Si sample implanted with 75 keV Ag to ...
Profiles of the depth distribution of Cu ions implanted at an energy of ...
Depth profiles of S for 6H-SiC implanted with 200 keV P ϩ at a dose ...
shows the TOF-SIMS depth profile of a SiO 2 film on a Si substrate ...
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Comparison of SIMS measured Cu depth profiles for the samples implanted ...
SIMS depth profiles of nine As + implanted (150 keV 1.0 × 10 13 cm −2 ...
Calculated x-ray penetration depth into SiO 2 , Si and Cu for 8keV ...
SIMS As profiles of poly-Si wafers implanted by As with 10-keV energy ...
Characterization of nanoscale atomic motion of Si in polycrystalline Cu ...
SIMS depth profiles of a 48 Ti 150 keV, 1E14 atoms/cm 2 ), and b 55 Mn ...